Others
SiH3Cl (Mono Chlorosilane)
SiH3Cl(MCS)is a precursor material used in the manufacturing of semiconductors and display.
SPECIFICATION
Unit : %SiH3Cl | SiH2Cl2 | SiH4 | N2 |
---|---|---|---|
98% | 0.03 | 2 | 0.1 |
CYLINDER INFORMATION
CYLINDER INFORMATION | MATERIAL | VALVE CONNECTION TYPE | FILLING WEIGHT |
---|---|---|---|
Individual Cylinder | Mn Steel, Cr-Mo Steel | CGA/DISS636 | 26 |
He (Helium)
Helium is an inert gas used widely across the industry s as a carrier gas, purge gas, cooling gas, tracer gas for leak detection, or entertaining gas.
Unit : ppmPurity | O2 | H2O | N2 | THC | CO | CO2 | Ne | Ar |
---|---|---|---|---|---|---|---|---|
≥ 99.9995 % | < 1.0 | < 0.5 | < 1.0 | < 0.1 | < 0.1 | < 0.1 | < 0.5 | < 0.5 |
He | SPECIFICATIO | |
---|---|---|
Purity | He | ≥ 99.9995 % |
Impurity (ppm) |
O2 | < 1.0 |
H2O | < 0.5 | |
N2 | < 1.0 | |
THC | < 0.1 | |
CO | < 0.1 | |
CO2 | < 0.1 | |
Ne | < 0.5 | |
Ar | < 0.5 |
SiCl4 (Silicon Tetrachloride)
SiCl4 is a gas which may be used with Si powder in the manufacturing of polysilicon wafers. It may be also used for deposition and etching during semiconductor fabrication.
Purity | N2 | O2 | CO2 | HCI |
---|---|---|---|---|
≥ 99.9999 % | < 1.0 | < 1.0 | < 1.0 | < 1.0 |
Na | Fe | Ni | Mn | Cr | Cu | Zn | Al | Ca | Co |
---|---|---|---|---|---|---|---|---|---|
< 1.0 | < 4.0 | < 4.0 | < 1.0 | < 1.0 | < 5.0 | < 1.0 | < 5.0 | < 2.0 | < 8.0 |
SiCl4 | SPECIFICATIO | |
---|---|---|
Purity | SiCl4 | ≥ 99.9999 % |
Impurity (ppm) |
N2 | < 1.0 |
O2 | < 1.0 | |
CO2 | < 1.0 | |
HCI | < 0.1 | |
Impurity (ppb) |
Na | < 1.0 |
Fe | < 4.0 | |
Ni | < 4.0 | |
Mn | < 1.0 | |
Cr | < 1.0 | |
Cu | < 5.0 | |
Zn | < 1.0 | |
Al | < 5.0 | |
Ca | < 2.0 | |
Co | < 8.0 |
Xe (Xenon)
Xenon is an inert, colorless, and odorless gas that may be acquired from air separation.
It could be mixed with other gases to produce lasers for display panels, semiconductors, and medical purposes.
The gas has steadily increased to be applied to various areas for diverse uses.
Purity | Kr | O2 | N2 | CO2 | CH4 | CF4 | C2F6 | SF6 | NO2 | H2O |
---|---|---|---|---|---|---|---|---|---|---|
≥ 99.9999 % | < 1.0 | < 1.0 | < 1.0 | < 1.0 | < 1.0 | < 1.0 | < 1.0 | < 1.0 | < 1.0 | < 1.0 |
Xe | SPECIFICATIO | |
---|---|---|
Purity | Xe | ≥ 99.9999 % |
Impurity (ppm) |
Kr | < 1.0 |
O2 | < 1.0 | |
N2 | < 1.0 | |
CO2 | < 1.0 | |
CH4 | < 1.0 | |
CF4 | < 1.0 | |
C2F6 | < 1.0 | |
SF6 | < 1.0 | |
NO2 | < 1.0 | |
H2O | < 1.0 |